Patent Analysis
Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.
Source record
Citations copied verbatim from the method’s source record. No claim-level verification is inferred from them.
- Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155. · DOI 10.1007/BF02017219
- Abbas, A., Zhang, L., & Khan, S. U. (2014). A literature review on the state-of-the-art in patent analysis. World Patent Information, 37, 3-13. · DOI 10.1016/j.wpi.2013.12.006
Curated claims
Claims persisted in the evidence ledger, each with its own assessment.
This view does not invent a claim assessment when the ledger has none.
Related methods
Generated from the method graph and shown as machine-suggested relations — no evidence claim is inferred.