Automatic Test Pattern Generation
Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.
Source record
Citations copied verbatim from the method’s source record. No claim-level verification is inferred from them.
- Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. · URL
- Roth, J. P. (1966). Diagnosis of automata failures: A calculus and a method. IBM Journal of Research and Development, 10(4), 278-291. · DOI 10.1147/rd.104.0278
- Goel, P. (1981). An implicit enumeration algorithm to generate tests for combinational circuits. IEEE Transactions on Computers, 30(3), 215-222. · URL
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