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Automatic Test Pattern Generation/Evidence
Method evidence record

Automatic Test Pattern Generation

Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.

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Citations copied verbatim from the method’s source record. No claim-level verification is inferred from them.

Automatic Test Pattern Generation for Digital Circuits
Taxonomic method record · process-pipeline / electrical-engineering
  • Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press. · URL
  • Roth, J. P. (1966). Diagnosis of automata failures: A calculus and a method. IBM Journal of Research and Development, 10(4), 278-291. · DOI 10.1147/rd.104.0278
  • Goel, P. (1981). An implicit enumeration algorithm to generate tests for combinational circuits. IEEE Transactions on Computers, 30(3), 215-222. · URL
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Related methods

Generated from the method graph and shown as machine-suggested relations — no evidence claim is inferred.

Same method familyLogic Synthesismachine-suggested · Relational suggestion, not evidence.Same method familyMonte Carlo Process Variationmachine-suggested · Relational suggestion, not evidence.Same method familyStatic Timing Analysismachine-suggested · Relational suggestion, not evidence.

Evidence status

Sources recorded, not reviewed

Bibliographic sources are present. Claim-level evidence review has not been performed.

Sources

3 recorded citations, copied from the method source record.

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