Attributes Control Chart
Attributes control charts extend Shewhart's framework to count and proportion data — quality characteristics that are classified rather than measured. The p- and np-charts monitor the proportion or number of defective items using the binomial distribution, while the c- and u-charts monitor the number of defects per unit using the Poisson distribution. They are the standard statistical-process-control tools when inspection yields pass/fail or defect counts rather than continuous measurements.
Source record
Citations copied verbatim from the method’s source record. No claim-level verification is inferred from them.
- Shewhart, W. A. (1931). Economic Control of Quality of Manufactured Product. D. Van Nostrand Company. · ISBN 978-0-87389-076-2
- Montgomery, D. C. (2009). Introduction to Statistical Quality Control (6th ed.). John Wiley & Sons. · ISBN 978-0-470-16992-6
Curated claims
Claims persisted in the evidence ledger, each with its own assessment.
This view does not invent a claim assessment when the ledger has none.
Related methods
Generated from the method graph and shown as machine-suggested relations — no evidence claim is inferred.