Σύγκριση μεθόδων

	Ανάταξη Rietveld με περίθλαση ακτίνων Χ (XRD)	Ηλεκτρονική Περίθλαση Επιλεγμένης Περιοχής
Πεδίο	Επιστήμη Υλικών	Επιστήμη Υλικών
Οικογένεια	Process / pipeline	Process / pipeline
Έτος προέλευσης	1969	1913
Δημιουργός	Hugo Rietveld	Georges Friedel
Τύπος	Refinement method	Diffraction technique
Θεμελιώδης πηγή	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.
Εναλλακτικές ονομασίες	Rietveld refinement, powder diffraction refinement	SAED, electron diffraction pattern, TEM diffraction
Συναφείς	3	3
Σύνοψη	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.