Σύγκριση μεθόδων

	Ηλεκτρονική Περίθλαση Επιλεγμένης Περιοχής	Ανάταξη Rietveld με περίθλαση ακτίνων Χ (XRD)
Πεδίο	Επιστήμη Υλικών	Επιστήμη Υλικών
Οικογένεια	Process / pipeline	Process / pipeline
Έτος προέλευσης	1913	1969
Δημιουργός	Georges Friedel	Hugo Rietveld
Τύπος	Diffraction technique	Refinement method
Θεμελιώδης πηγή	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Εναλλακτικές ονομασίες	SAED, electron diffraction pattern, TEM diffraction	Rietveld refinement, powder diffraction refinement
Συναφείς	3	3
Σύνοψη	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.