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| Model de Rasch× | Model logístic de resposta a l'ítem de dos paràmetres (2PL)× | |
|---|---|---|
| Camp | Psicometria | Psicometria |
| Família | Latent structure | Latent structure |
| Any d'origen≠ | 1960 | 1980 |
| Autor original≠ | Georg Rasch | Frederic M. Lord |
| Tipus≠ | Item Response Theory / Latent trait model | Item response model / latent trait model |
| Font seminal≠ | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ | Lord, F. M. (1980). Applications of Item Response Theory to Practical Testing Problems. Erlbaum. link ↗ |
| Àlies≠ | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model | two-parameter logistic model, 2PL model, 2PL IRT — İki Parametreli Madde Tepki Modeli |
| Relacionats | 6 | 6 |
| Resum≠ | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. | The two-parameter logistic item response model, formalised by Frederic Lord (1980), describes the probability that a respondent answers a binary test item correctly as a smooth S-shaped function of the respondent's latent ability. By estimating a separate discrimination parameter for each item alongside a difficulty parameter, 2PL allows items to differ in how sharply they distinguish high- from low-ability respondents — making it the standard model for large-scale educational and psychological assessments. |
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