পদ্ধতির তুলনা করুন

	নির্বাচিত এলাকা ইলেকট্রন ডিফ্র্যাকশন	Atomic Force Microscopy
ক্ষেত্র	উপাদান বিজ্ঞান	উপাদান বিজ্ঞান
পরিবার	Process / pipeline	Process / pipeline
উদ্ভবের বছর	1913	1986
প্রবর্তক	Georges Friedel	Gerd Binnig
ধরন	Diffraction technique	Imaging technique
মৌলিক উৎস	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.
অপর নাম	SAED, electron diffraction pattern, TEM diffraction	AFM, scanning probe microscopy, nanoindentation microscopy
সম্পর্কিত	3	3
সারসংক্ষেপ	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.