পদ্ধতির তুলনা করুন

	ব্রেউশ-গডফ্রে এলএম টেস্ট ফর সিরিয়াল কোরিলেশন	CIPS Test
ক্ষেত্র	অর্থমিতি	অর্থমিতি
পরিবার	Regression model	Hypothesis test
উদ্ভবের বছর	1978	2007
প্রবর্তক	Trevor Breusch & Leslie Godfrey	M. Hashem Pesaran
ধরন	Lagrange-multiplier test for serial correlation	Panel unit-root test with cross-section dependence
মৌলিক উৎস	Godfrey, L. G. (1978). Testing against general autoregressive and moving average error models when the regressors include lagged dependent variables. Econometrica, 46(6), 1293–1301.	Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312.
অপর নাম	BG test, LM test for autocorrelation, Breusch-Godfrey serial correlation test, Breusch-Godfrey otokorelasyon testi	Pesaran CIPS Test, Cross-Sectionally Augmented IPS, Second-Generation Panel Unit-Root Test, CIPS Birim Kök Testi
সম্পর্কিত	3	3
সারসংক্ষেপ	The Breusch-Godfrey test is a Lagrange-multiplier test for serial correlation in regression residuals, developed independently by Trevor Breusch (1978) and Leslie Godfrey (1978). Unlike the Durbin-Watson test, it detects autocorrelation up to any chosen order p, remains valid when the model includes lagged dependent variables, and produces a definite chi-square p-value rather than an inconclusive region — making it the modern standard for autocorrelation testing.	The CIPS test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed for panels in which the cross-sectional units share unobserved common factors that induce cross-section dependence. By augmenting each individual ADF regression with cross-sectional averages and their lags, the CIPS test accounts for this dependence and produces reliable inference where first-generation tests such as the original IPS test break down. It is widely applied in macroeconomic and finance panels where shocks propagate across countries or regions.