ScholarGate
Асистент

Сравнение на методи

Прегледайте избраните методи един до друг; редовете с разлики са откроени.

Динамично разсейване на светлина×Атомно-силова микроскопия×BET повърхностна площ×
ОбластМатериалознаниеМатериалознаниеМатериалознание
СемействоProcess / pipelineProcess / pipelineProcess / pipeline
Година на възникване196419861938
СъздателRobert PecoraGerd BinnigBrunauer, Emmett, Teller
ТипMeasurement methodImaging techniqueMeasurement method
Основополагащ източникPecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070. link ↗Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. DOI ↗Brunauer, S., Emmett, P. H., & Teller, E. (1938). Adsorption of gases in multimolecular layers. Journal of the American Chemical Society, 60(2), 309-319. DOI ↗
Други названияDLS, photon correlation spectroscopy, particle size measurementAFM, scanning probe microscopy, nanoindentation microscopyBET analysis, nitrogen adsorption, surface area measurement
Свързани333
РезюмеDynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.Brunauer-Emmett-Teller (BET) Surface Area Analysis is a technique for measuring the specific surface area of solids by analyzing their nitrogen adsorption isotherms. Developed by Brunauer, Emmett, and Teller in 1938, BET theory extends monolayer adsorption (Langmuir) to multilayer adsorption, enabling quantification of surface area of porous and powdered materials. It is the industry standard for characterizing catalysts, adsorbents, pharmaceuticals, and porous materials, providing critical data for performance prediction and quality control.
ScholarGateНабор от данни
  1. v1
  2. 3 Източници
  3. PUBLISHED
  1. v1
  2. 3 Източници
  3. PUBLISHED
  1. v1
  2. 3 Източници
  3. PUBLISHED

Към търсенето Изтегляне на слайдове

ScholarGateСравнение на методи: Dynamic Light Scattering · Atomic Force Microscopy · BET Surface Area. Извлечено на 2026-06-19 от https://scholargate.app/bg/compare