قارن الطرق

	SIBTEST	نموذج DINA
المجال	القياس النفسي	القياس النفسي
العائلة	Latent structure	Latent structure
سنة النشأة	1993	2001
صاحب الطريقة	Richard Shealy, William F. Stout	Brian Junker, Klaas Sijtsma
النوع	Differential item functioning (DIF) assessment	Discrete latent class model
المصدر التأسيسي	Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194.	Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272.
الأسماء البديلة	—	DINA
ذات صلة	5	4
الملخص	SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.	The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips.