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| Kiểm tra Thích ứng Máy tính với Mô hình Rasch (CAT-Rasch)× | Mô hình Rasch× | |
|---|---|---|
| Lĩnh vực | Trắc lượng tâm lý | Trắc lượng tâm lý |
| Họ | Latent structure | Latent structure |
| Năm ra đời≠ | 1960 (Rasch model); CAT integration from 1970s onward | 1960 |
| Người khởi xướng≠ | Georg Rasch (measurement model); adaptive testing formalized by Wainer, van der Linden, and others | Georg Rasch |
| Loại≠ | Adaptive psychometric measurement | Item Response Theory / Latent trait model |
| Công trình gốc≠ | Wainer, H. (Ed.). (2000). Computerized Adaptive Testing: A Primer (2nd ed.). Lawrence Erlbaum Associates. ISBN: 978-0805835113 | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| Tên gọi khác | CAT-Rasch, Rasch-based CAT, adaptive Rasch testing, computerized adaptive measurement | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| Liên quan≠ | 5 | 6 |
| Tóm tắt≠ | Computerized adaptive testing with the Rasch model selects items in real time based on each examinee's evolving ability estimate, so that every person receives a test precisely calibrated to their proficiency level. The result is a shorter, more efficient measurement instrument that loses none of the precision of a full-length fixed-form test. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
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