So sánh phương pháp

	Điểm Kiểm Tra Tinh Thần Rút Gọn	Bộ đánh giá chức năng trán (Frontal Assessment Battery - FAB)
Lĩnh vực	Tâm lý học thần kinh	Tâm lý học thần kinh
Họ	Process / pipeline	Process / pipeline
Năm ra đời	1972	2000
Người khởi xướng	H. Mark Hodkinson	Bruno Dubois
Loại	Brief clinician-administered cognitive screening instrument	Clinician-administered neuropsychological battery for frontal lobe function
Công trình gốc	Hodkinson, H. M. (1972). Evaluation of a mental test score for assessment of mental impairment in the elderly. Age and Ageing, 1(4), 233-238.	Dubois, B., Slachevsky, A., Litvan, I., & Pillon, B. (2000). The FAB: A Frontal Assessment Battery at bedside. Neurology, 55(11), 1621-1626.
Tên gọi khác	AMT, AMT4, Abbreviated Mental Test Score	FAB, Frontal Battery
Liên quan	5	5
Tóm tắt	The Abbreviated Mental Test (AMT) is a brief, 10-item cognitive screening instrument developed by Hodkinson in 1972 and originally published in Age and Ageing. It was specifically designed to quickly assess cognitive function in older hospitalized patients, detecting delirium and dementia in acute hospital settings. The AMT is valued for its simplicity, brevity (2–3 minutes), and utility in fast-paced clinical environments where quick cognitive triage is essential.	The Frontal Assessment Battery (FAB) is a brief, clinician-administered neuropsychological battery designed to assess frontal lobe function and executive abilities at the bedside. Developed by Dubois and colleagues at the Salpêtrière Hospital in Paris in 2000, the FAB consists of six subtests measuring conceptualization, mental flexibility, motor planning, inhibitory control, and verbal fluency. The FAB is particularly sensitive to frontotemporal dementia, Parkinson's disease with cognitive decline, and other conditions affecting prefrontal function.