Порівняння методів

	Self-Report Delinquency Scale	Criminal Career Paradigm
Галузь	Criminology	Criminology
Родина	Process / pipeline	Process / pipeline
Рік появи	1980	1986
Автор методу	Delbert S. Elliott & Suzanne S. Ageton	Alfred Blumstein, Jacqueline Cohen, Jeffrey Roth & Christy Visher
Тип	Self-report behavioral measurement instrument	Conceptual framework for decomposing offending over the life course
Основоположне джерело	Elliott, D. S., & Ageton, S. S. (1980). Reconciling race and class differences in self-reported and official estimates of delinquency. American Sociological Review, 45(1), 95–110.	Blumstein, A., Cohen, J., Roth, J. A., & Visher, C. A. (Eds.). (1986). Criminal Careers and 'Career Criminals' (Vols. 1–2). National Academy Press. ISBN: 9780309036887
Інші назви	SRD Scale, Self-Reported Delinquency Measure, Self-Report Offending Inventory, National Youth Survey Delinquency Scale	Criminal Careers Framework, Career Criminal Paradigm, Offending Career Approach, Blumstein Criminal Career Model
Пов'язані	4	4
Підсумок	A self-report delinquency (SRD) scale measures offending by asking respondents directly how often they have committed specific delinquent or criminal acts, rather than relying on arrests or convictions. The modern frequency-based approach was established by Delbert Elliott and Suzanne Ageton in 1980 for the National Youth Survey, designed to capture the full range and frequency of offending and to overcome the biases of official crime records.	The criminal career paradigm is a framework for studying offending as a longitudinal sequence in an individual's life rather than as undifferentiated aggregate crime. Codified by Blumstein, Cohen, Roth, and Visher in the 1986 National Academy of Sciences report, it decomposes crime into distinct dimensions — whether someone offends (participation), how often active offenders offend (frequency, λ), and the onset, seriousness, and duration of the career — each potentially with different causes.