Порівняння методів
Переглядайте обрані методи поруч; рядки з відмінностями підсвічено.
| Статистичне управління процесами на основі ризиків× | Аналіз придатності процесу (Cp, Cpk)× | |
|---|---|---|
| Галузь≠ | Планування експерименту | Статистика |
| Родина | Process / pipeline | Process / pipeline |
| Рік появи≠ | 1920s (SPC foundations); risk-based integration formalized in 2000s–2010s | 1986 |
| Автор методу≠ | Integrated from SPC (Shewhart, 1920s; Deming, 1950s) and risk analysis frameworks (FDA ICH Q10, ISO 31000) | Victor Kane |
| Тип≠ | Hybrid quality-risk engineering method | Quantitative process evaluation index |
| Основоположне джерело≠ | Montgomery, D. C. (2020). Introduction to Statistical Quality Control (8th ed.). Wiley. ISBN: 978-1119399308 | Kane, V. E. (1986). Process capability indices. Journal of Quality Technology, 18(1), 41–52. DOI ↗ |
| Інші назви | Risk-based SPC, RBSPC, risk-prioritized SPC, risk-informed process monitoring | Process Capability Indices, Capability Study, Süreç Yeterlilik Analizi, Process Performance Analysis |
| Пов'язані≠ | 6 | 2 |
| Підсумок≠ | Risk-based statistical process control (Risk-based SPC) is an engineering quality method that integrates formal risk analysis — typically FMEA or a risk matrix — with statistical process monitoring to focus control chart resources on the process parameters that pose the greatest risk to product quality or system safety. Rather than applying control charts uniformly across all variables, risk-based SPC directs tighter monitoring toward high-risk, high-impact process characteristics identified through structured hazard prioritization. | Process Capability Analysis quantifies how well a manufacturing or business process produces output within specified tolerance limits. Introduced formally by Victor Kane in 1986, it summarises process spread and centering into dimensionless indices — most notably Cp and Cpk — allowing engineers and quality managers to judge whether a stable process is inherently capable of meeting customer or design specifications consistently. |
| ScholarGateНабір даних ↗ |
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