Порівняння методів

	Навчання з малою кількістю прикладів	Навчання метрик
Галузь	Машинне навчання	Машинне навчання
Родина	Machine learning	Machine learning
Рік появи	2011–2017	2003 (foundational); refined 2009 (LMNN)
Автор методу	Lake, B. M.; Vinyals, O.; Finn, C. et al.	Xing, E. P.; Jordan, M. I.; Russell, S.; Ng, A. Y.
Тип	Meta-learning / low-data learning paradigm	Representation learning / supervised distance optimization
Основоположне джерело	Vinyals, O., Blundell, C., Lillicrap, T., Wierstra, D., & Kavukcuoglu, K. (2016). Matching Networks for One Shot Learning. Advances in Neural Information Processing Systems (NeurIPS), 29.	Xing, E. P., Jordan, M. I., Russell, S., & Ng, A. Y. (2003). Distance metric learning with application to clustering with side-information. In Advances in Neural Information Processing Systems (NIPS), 16, 505–512.
Інші назви	FSL, low-shot learning, k-shot learning, meta-learning for few examples	Distance Metric Learning, Similarity Learning, DML, Representation Learning via Distance
Пов'язані	4	5
Підсумок	Few-shot learning is a machine learning paradigm that trains models to recognize new classes or solve new tasks from only a handful of labeled examples — typically one to five — by leveraging prior knowledge acquired from a large, related training distribution. It is especially relevant in domains where labeling is expensive, scarce, or structurally limited.	Metric learning is a machine-learning framework that trains a distance or similarity function from data so that semantically similar examples end up close together in the learned space while dissimilar examples are pushed apart. Unlike fixed distances such as Euclidean, the learned metric adapts to the structure of the task, making downstream classifiers, clusterers, and retrieval systems significantly more accurate.