Порівняння методів

	Differential Item Functioning in Educational Testing	Диференційне функціонування елемента (DIF)
Галузь	Education	Психометрія
Родина	Latent structure	Latent structure
Рік появи	1993	1970s–1993
Автор методу	Educational measurement / test-fairness tradition (Holland, Wainer, Dorans, Thissen)	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
Тип	Test-fairness analysis detecting items that function differently across groups	Item-level bias detection
Основоположне джерело	Holland, P. W., & Wainer, H. (Eds.). (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 9780805809725	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
Інші назви	Educational DIF Analysis, Item Bias Detection in Tests, Test Fairness DIF, Mantel-Haenszel DIF	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Пов'язані	4	5
Підсумок	Differential item functioning (DIF) analysis is the central statistical tool for evaluating the fairness of test items in education. An item shows DIF when examinees of equal ability but different group membership — for example by gender, race/ethnicity, or language background — have unequal probabilities of answering it correctly. By conditioning on ability before comparing groups, DIF analysis separates genuine item bias from real group differences in proficiency, and flags items for expert review before they affect high-stakes decisions.	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.