Порівняння методів

	Аналіз диференційного функціонування елементів (DIF)	Аналіз елементів (Класична теорія тесту)
Галузь	Психометрія	Психометрія
Родина	Latent structure	Latent structure
Рік появи	1988	1979
Автор методу	Paul W. Holland & Dorothy T. Thayer (Mantel-Haenszel approach, 1988)	Classical Test Theory tradition; foundational texts by Allen & Yen (1979) and Crocker & Algina (1986)
Тип	Item-level fairness / measurement equivalence analysis	Descriptive / psychometric screening
Основоположне джерело	Holland, P. W. & Thayer, D. T. (1988). Differential Item Performance and the Mantel-Haenszel Procedure. ETS Research Report Series.	Allen, M. J. & Yen, W. M. (1979). Introduction to Measurement Theory. Brooks/Cole. ISBN: 978-0818501333
Інші назви	Madde Yanlılık Analizi (DIF — Differential Item Functioning), item bias analysis, Mantel-Haenszel DIF, Lord chi-square DIF	Madde Analizi (Klasik Test Kuramı), CTT item analysis, classical item analysis
Пов'язані	4	5
Підсумок	Differential Item Functioning analysis examines whether examinees from different groups — such as gender, ethnicity, or language background — who have the same underlying ability respond differently to a test item. First formalised by Holland and Thayer in 1988 via the Mantel-Haenszel procedure, it is the principal tool in modern test development for detecting and removing item bias.	Item analysis is the foundational psychometric procedure for evaluating the quality of individual test or scale items within the Classical Test Theory (CTT) framework, as systematised by Allen and Yen (1979) and Crocker and Algina (1986). It produces an item difficulty index, an item discrimination index, and a distractor analysis for each item, enabling test developers to identify items that are too easy, too hard, or failing to separate high- and low-ability respondents.