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SIBTEST×Modeli DINA×
FushaPsikometriPsikometri
FamiljaLatent structureLatent structure
Viti i origjinës19932001
KrijuesiRichard Shealy, William F. StoutBrian Junker, Klaas Sijtsma
LlojiDifferential item functioning (DIF) assessmentDiscrete latent class model
Burimi themeluesShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272. DOI ↗
Emërtime të tjeraDINA
Të lidhura54
PërmbledhjaSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips.
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ScholarGateKrahasoni metodat: SIBTEST · DINA Model. Marrë më 2026-06-17 nga https://scholargate.app/sq/compare