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| Uczenie metryczne× | Proces Gaussa× | |
|---|---|---|
| Dziedzina | Uczenie maszynowe | Uczenie maszynowe |
| Rodzina | Machine learning | Machine learning |
| Rok powstania≠ | 2003 (foundational); refined 2009 (LMNN) | 2006 (book); roots in Kriging, 1951) |
| Twórca≠ | Xing, E. P.; Jordan, M. I.; Russell, S.; Ng, A. Y. | Rasmussen, C. E. & Williams, C. K. I. |
| Typ≠ | Representation learning / supervised distance optimization | Probabilistic non-parametric model |
| Źródło pierwotne≠ | Xing, E. P., Jordan, M. I., Russell, S., & Ng, A. Y. (2003). Distance metric learning with application to clustering with side-information. In Advances in Neural Information Processing Systems (NIPS), 16, 505–512. link ↗ | Rasmussen, C. E., & Williams, C. K. I. (2006). Gaussian Processes for Machine Learning. MIT Press. ISBN: 978-0-262-18253-9 |
| Inne nazwy | Distance Metric Learning, Similarity Learning, DML, Representation Learning via Distance | GP, Gaussian Process Regression, GPR, Kriging |
| Pokrewne≠ | 5 | 3 |
| Podsumowanie≠ | Metric learning is a machine-learning framework that trains a distance or similarity function from data so that semantically similar examples end up close together in the learned space while dissimilar examples are pushed apart. Unlike fixed distances such as Euclidean, the learned metric adapts to the structure of the task, making downstream classifiers, clusterers, and retrieval systems significantly more accurate. | A Gaussian Process (GP) is a non-parametric, fully probabilistic machine learning model that places a prior distribution directly over functions. Rather than predicting a single value, it returns a predictive mean and a calibrated uncertainty estimate at every test point, making it especially valuable for regression on small to medium datasets and for Bayesian optimization tasks. |
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