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Procesbekwaamheidsanalyse (Cp, Cpk)×Shewhart regelkaart voor variabelen (X-gemiddelde / R)×Six Sigma DMAIC×
VakgebiedStatistiekStatistiekKwaliteitsmanagement
FamilieProcess / pipelineProcess / pipelineProcess / pipeline
Jaar van ontstaan198619312014
GrondleggerVictor KaneWalter A. ShewhartMotorola; Pyzdek & Keller
TypeQuantitative process evaluation indexStatistical process control chart for variablesStructured process improvement methodology
Oorspronkelijke bronKane, V. E. (1986). Process capability indices. Journal of Quality Technology, 18(1), 41–52. DOI ↗Shewhart, W. A. (1931). Economic Control of Quality of Manufactured Product. D. Van Nostrand Company. ISBN: 978-0-87389-076-2Pyzdek, T., & Keller, P. (2014). The Six Sigma Handbook (4th ed.). McGraw-Hill. ISBN: 978-0-07-184053-9
AliassenProcess Capability Indices, Capability Study, Süreç Yeterlilik Analizi, Process Performance AnalysisX-bar and R chart, Shewhart chart, variables control chart, process control chartDMAIC Framework, Six Sigma Process Improvement Cycle, Define-Measure-Analyze-Improve-Control, Altı Sigma DMAIC
Verwant243
SamenvattingProcess Capability Analysis quantifies how well a manufacturing or business process produces output within specified tolerance limits. Introduced formally by Victor Kane in 1986, it summarises process spread and centering into dimensionless indices — most notably Cp and Cpk — allowing engineers and quality managers to judge whether a stable process is inherently capable of meeting customer or design specifications consistently.The Shewhart control chart, invented by Walter Shewhart at Bell Labs in the 1920s and set out in his 1931 book, is the foundational tool of statistical process control. It plots a process statistic — typically the subgroup mean (X-bar) and range (R) — over time against a center line and three-sigma control limits, distinguishing the natural common-cause variation inherent in a stable process from special-cause variation that signals something has changed and warrants investigation.Six Sigma DMAIC is a data-driven, five-phase process improvement methodology — Define, Measure, Analyze, Improve, and Control — used to reduce defects and process variation to fewer than 3.4 defects per million opportunities. Originating at Motorola in the 1980s and systematized by practitioners including Pyzdek and Keller, it is widely adopted in manufacturing, healthcare, finance, and service industries seeking sustained quality gains.
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ScholarGateMethoden vergelijken: Process Capability Analysis · Shewhart Control Chart · Six Sigma DMAIC. Geraadpleegd op 2026-06-18 via https://scholargate.app/nl/compare