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X-ray Photoelectron Spectroscopy

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a surface-sensitive analytical technique that measures the kinetic energies of photoelectrons ejected from a material by high-energy X-rays. Developed by Kai Siegbahn in 1967, XPS determines elemental composition, chemical oxidation states, and chemical bonding within ~10 nanometers of a surface. It is indispensable in materials science for surface characterization, corrosion studies, oxide analysis, and interface chemistry.

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X-ray Photoelectron Spectroscopy (XPS)

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Same method familyEnergy-Dispersive X-ray Spectroscopymachine-suggested · Relational suggestion, not evidence.Same method familyRaman Deconvolutionmachine-suggested · Relational suggestion, not evidence.Same method familySelected Area Electron Diffractionmachine-suggested · Relational suggestion, not evidence.