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Kebolehpercayaan Uji-Ulang Bentuk Pendek×Teori Gerak Balas Item (IRT)×
BidangPsikometrikPsikometrik
KeluargaLatent structureLatent structure
Tahun asal1990s–2000s1952–1968
PengasasDerived from classical test-retest reliability; short-form methodology formalised by Smith, McCarthy & Anderson (2000) among othersFrederic M. Lord (and Allan Birnbaum for the 2PL/3PL models)
JenisReliability estimationProbabilistic measurement model
Sumber perintisSmith, G. T., McCarthy, D. M., & Anderson, K. G. (2000). On the sins of short-form development. Psychological Assessment, 12(1), 102–111. DOI ↗Lord, F. M. & Novick, M. R. (1968). Statistical Theories of Mental Test Scores. Addison-Wesley. link ↗
Aliasabbreviated scale temporal stability, short-form temporal consistency, retest reliability of short forms, SF test-retestIRT, latent trait theory, item characteristic curve theory, modern test theory
Berkaitan45
RingkasanShort-form test-retest reliability quantifies how consistently an abbreviated version of a measurement instrument produces the same scores across two administrations separated by a defined time interval. It is a critical validation step whenever a full-length scale is shortened for practical use, confirming that item reduction has not degraded temporal stability.Item response theory models the probability that a respondent answers an item correctly (or endorses it) as a function of the respondent's latent trait level and the item's own statistical properties — difficulty, discrimination, and guessing. Unlike classical test theory, IRT places persons and items on the same scale, yielding measurement that is sample-independent for items and test-independent for persons.
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ScholarGateBandingkan kaedah: Short-form test-retest reliability · Item Response Theory. Dicapai 2026-06-19 daripada https://scholargate.app/ms/compare