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| Model Rasch Bentuk Pendek× | Teori Gerak Balas Item (IRT)× | |
|---|---|---|
| Bidang | Psikometrik | Psikometrik |
| Keluarga | Latent structure | Latent structure |
| Tahun asal≠ | 1960 (Rasch model); short-form application from 1980s onward | 1952–1968 |
| Pengasas≠ | Georg Rasch | Frederic M. Lord (and Allan Birnbaum for the 2PL/3PL models) |
| Jenis≠ | Probabilistic item response model | Probabilistic measurement model |
| Sumber perintis≠ | Rasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut. link ↗ | Lord, F. M. & Novick, M. R. (1968). Statistical Theories of Mental Test Scores. Addison-Wesley. link ↗ |
| Alias≠ | Rasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch model | IRT, latent trait theory, item characteristic curve theory, modern test theory |
| Berkaitan≠ | 6 | 5 |
| Ringkasan≠ | The short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items. | Item response theory models the probability that a respondent answers an item correctly (or endorses it) as a function of the respondent's latent trait level and the item's own statistical properties — difficulty, discrimination, and guessing. Unlike classical test theory, IRT places persons and items on the same scale, yielding measurement that is sample-independent for items and test-independent for persons. |
| ScholarGateSet data ↗ |
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