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| Teori Respons Item Bentuk Pendek (SF-IRT)× | Model Rasch× | |
|---|---|---|
| Bidang | Psikometrik | Psikometrik |
| Keluarga | Latent structure | Latent structure |
| Tahun asal≠ | 1980s–2000s | 1960 |
| Pengasas≠ | Multiple contributors; IRT adapted to short-form contexts from Lord & Novick (1968) and subsequent applied psychometricians | Georg Rasch |
| Jenis≠ | Latent trait / item calibration model | Item Response Theory / Latent trait model |
| Sumber perintis≠ | Embretson, S. E. & Reise, S. P. (2000). Item Response Theory for Psychologists. Lawrence Erlbaum Associates. ISBN: 978-0805828191 | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| Alias | SF-IRT, abbreviated scale IRT, short-form calibration, shortened instrument IRT | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| Berkaitan | 6 | 6 |
| Ringkasan≠ | Short-form item response theory applies IRT calibration and scoring to abbreviated or shortened psychological scales. It uses item information functions to guide which items to retain from a full-length instrument, then estimates latent trait scores from the reduced item set while preserving psychometric rigor and linkage to the full-scale metric. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
| ScholarGateSet data ↗ |
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