Bandingkan kaedah

	Patent Analysis	Technology Delphi
Bidang	Science Technology Studies	Science Technology Studies
Keluarga	Process / pipeline	Process / pipeline
Tahun asal	1994	1975
Pengasas	Francis Narin (patent bibliometrics) and the patent-analytics community	Helmer & Dalkey (RAND); national applications by NISTEP (Japan) and Cuhls (Germany)
Jenis	Document-based technological-intelligence process	Iterative structured expert-survey process
Sumber perintis	Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155.	Linstone, H. A., & Turoff, M. (Eds.). (1975). The Delphi Method: Techniques and Applications. Addison-Wesley. ISBN: 9780201042948
Alias	Patent analytics, Patent bibliometrics, Patent landscaping	Technology Delphi survey, Foresight Delphi, National Delphi forecast
Berkaitan	4	4
Ringkasan	Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.	The technology Delphi is a large-scale, multi-round expert survey used to forecast the timing, importance, and feasibility of future technological developments. Built on the classic Delphi principles of anonymity, iteration, controlled feedback, and statistical aggregation, it elicits judgements from hundreds or thousands of experts on a structured list of technology statements and converges them, round by round, into a collective forecast that informs national and organisational science and technology priorities.