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| Many-Facet Rasch Measurement× | Model Rasch× | |
|---|---|---|
| Bidang≠ | Education | Psikometrik |
| Keluarga | Latent structure | Latent structure |
| Tahun asal≠ | 1989 | 1960 |
| Pengasas≠ | John Michael Linacre | Georg Rasch |
| Jenis≠ | Rasch model extension adding rater and other facets to person and item | Item Response Theory / Latent trait model |
| Sumber perintis≠ | Linacre, J. M. (1989). Many-Facet Rasch Measurement. MESA Press. ISBN: 9780941938020 | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| Alias | MFRM, Many-Faceted Rasch Model, Facets Model, Linacre Facets Model | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| Berkaitan≠ | 4 | 6 |
| Ringkasan≠ | Many-facet Rasch measurement (MFRM) extends the basic Rasch model to assessments mediated by raters. Beyond examinee ability and item difficulty, it adds explicit parameters for rater severity and for any other facet of the rating situation — task, occasion, rating criterion — placing them all on one common logit scale. Developed by John Michael Linacre, MFRM lets analysts estimate and adjust for the fact that some raters are systematically harsh and others lenient, producing 'fair' ability estimates that do not penalize an examinee for happening to draw a severe judge. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
| ScholarGateSet data ↗ |
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