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SIBTEST×संज्ञानात्मक नैदानिक कंप्यूटरीकृत अनुकूली परीक्षण×
क्षेत्रमनोमितिमनोमिति
परिवारLatent structureLatent structure
उद्भव वर्ष19932007
प्रवर्तकRichard Shealy, William F. StoutXueli Xu, Jean-Paul Fox
प्रकारDifferential item functioning (DIF) assessmentSkill-adaptive testing with psychometric diagnostic classification
मौलिक स्रोतShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Choi, K. M., Lee, Y. S., & Park, Y. S. (2015). What CDM can tell about examinees' strengths and weaknesses: Cognitive diagnostic information in TIMSS. Journal of Educational Evaluation for Policy Analysis, 24(1), 79-100. link ↗
उपनामCD-CAT
संबंधित55
सारांशSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.Cognitive Diagnostic Computerized Adaptive Testing (CD-CAT) combines computerized adaptive testing (CAT) with cognitive diagnostic models (CDMs) to efficiently assess students' specific skill profiles. Rather than producing a single overall ability score, CD-CAT adaptively selects items to quickly identify which skills a student has mastered and which need development.
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  3. PUBLISHED
  1. v1
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  3. PUBLISHED

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