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लघु-रूप परीक्षण-पुनर्परीक्षण विश्वसनीयता×पुनः परीक्षण विश्वसनीयता (Test-Retest Reliability)×
क्षेत्रमनोमितिमनोमिति
परिवारLatent structureLatent structure
उद्भव वर्ष1990s–2000s1904
प्रवर्तकDerived from classical test-retest reliability; short-form methodology formalised by Smith, McCarthy & Anderson (2000) among othersKarl Pearson
प्रकारReliability estimationReliability estimate
मौलिक स्रोतSmith, G. T., McCarthy, D. M., & Anderson, K. G. (2000). On the sins of short-form development. Psychological Assessment, 12(1), 102–111. DOI ↗Nunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070478497
उपनामabbreviated scale temporal stability, short-form temporal consistency, retest reliability of short forms, SF test-reteststability reliability, temporal stability, repeatability coefficient, TRT reliability
संबंधित44
सारांशShort-form test-retest reliability quantifies how consistently an abbreviated version of a measurement instrument produces the same scores across two administrations separated by a defined time interval. It is a critical validation step whenever a full-length scale is shortened for practical use, confirming that item reduction has not degraded temporal stability.Test-retest reliability quantifies the temporal consistency of a measure by correlating scores obtained from the same participants on two separate occasions. It is a cornerstone of psychometric validation, directly indicating whether a scale or instrument yields stable scores when the underlying construct has not changed.
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