विधियों की तुलना करें

	Patent Analysis	Technology Delphi
क्षेत्र	Science Technology Studies	Science Technology Studies
परिवार	Process / pipeline	Process / pipeline
उद्भव वर्ष	1994	1975
प्रवर्तक	Francis Narin (patent bibliometrics) and the patent-analytics community	Helmer & Dalkey (RAND); national applications by NISTEP (Japan) and Cuhls (Germany)
प्रकार	Document-based technological-intelligence process	Iterative structured expert-survey process
मौलिक स्रोत	Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155.	Linstone, H. A., & Turoff, M. (Eds.). (1975). The Delphi Method: Techniques and Applications. Addison-Wesley. ISBN: 9780201042948
उपनाम	Patent analytics, Patent bibliometrics, Patent landscaping	Technology Delphi survey, Foresight Delphi, National Delphi forecast
संबंधित	4	4
सारांश	Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.	The technology Delphi is a large-scale, multi-round expert survey used to forecast the timing, importance, and feasibility of future technological developments. Built on the classic Delphi principles of anonymity, iteration, controlled feedback, and statistical aggregation, it elicits judgements from hundreds or thousands of experts on a structured list of technology statements and converges them, round by round, into a collective forecast that informs national and organisational science and technology priorities.