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PANIC परीक्षण: सामान्य कारक अपघटन के साथ पैनल इकाई मूल विश्लेषण×क्रॉस-सेक्शनली ऑगमेंटेड डिकी-फुलर (CADF) टेस्ट×
क्षेत्रअर्थमितिअर्थमिति
परिवारHypothesis testHypothesis test
उद्भव वर्ष20042007
प्रवर्तकJushan Bai & Serena NgM. Hashem Pesaran
प्रकारPanel unit root testPanel unit-root test with cross-sectional augmentation
मौलिक स्रोतBai, J., & Ng, S. (2004). A PANIC attack on unit roots and cointegration. Econometrica, 72(4), 1127–1177. DOI ↗Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312. DOI ↗
उपनामPanel Analysis of Non-stationarity in Idiosyncratic and Common Components, Bai-Ng PANIC Test, Second-Generation Panel Unit Root Test, Panel Birim Kök Testi (PANIC)Cross-Sectionally Augmented ADF, Panel CADF Test, Pesaran Panel Unit Root Test, CADF Birim Kök Testi
संबंधित33
सारांशPANIC (Panel Analysis of Non-stationarity in Idiosyncratic and Common Components) is a second-generation panel unit root test introduced by Bai and Ng (2004). It decomposes each panel series into common factors and idiosyncratic components, then tests for unit roots in each part separately, making it robust to cross-sectional dependence — a critical limitation of first-generation tests such as IPS or LLC.The Cross-sectionally Augmented Dickey-Fuller (CADF) test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed to handle cross-sectional dependence among panel units. Unlike first-generation panel unit-root tests that assume cross-sectional independence, the CADF test augments individual ADF regressions with cross-sectional averages of lagged levels and first differences, making it suitable for macro-panels and cross-country studies where common factors drive co-movement.
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