विधियों की तुलना करें
चुनी हुई विधियों की आमने-सामने समीक्षा करें; भिन्नता वाली पंक्तियाँ रेखांकित हैं।
| EXAFS× | एटीआर-एफटीआईआर× | |
|---|---|---|
| क्षेत्र | स्पेक्ट्रोस्कोपी | स्पेक्ट्रोस्कोपी |
| परिवार | Process / pipeline | Process / pipeline |
| उद्भव वर्ष≠ | 1971 | 1961 |
| प्रवर्तक≠ | Edward Stern | Joop Fahrenfort |
| प्रकार≠ | Synchrotron technique | Vibrational spectroscopy technique |
| मौलिक स्रोत≠ | Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI ↗ | Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155. link ↗ |
| उपनाम≠ | EXAFS spectroscopy, X-ray absorption spectroscopy | ATR-IR, attenuated total reflectance, FTIR spectroscopy |
| संबंधित | 3 | 3 |
| सारांश≠ | Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge. | Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation. |
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