विधियों की तुलना करें

	विभेदक मद विश्लेषण (Differential Item Functioning - DIF)	मद विश्लेषण (शास्त्रीय परीक्षण सिद्धांत)
क्षेत्र	मनोमिति	मनोमिति
परिवार	Latent structure	Latent structure
उद्भव वर्ष	1988	1979
प्रवर्तक	Paul W. Holland & Dorothy T. Thayer (Mantel-Haenszel approach, 1988)	Classical Test Theory tradition; foundational texts by Allen & Yen (1979) and Crocker & Algina (1986)
प्रकार	Item-level fairness / measurement equivalence analysis	Descriptive / psychometric screening
मौलिक स्रोत	Holland, P. W. & Thayer, D. T. (1988). Differential Item Performance and the Mantel-Haenszel Procedure. ETS Research Report Series.	Allen, M. J. & Yen, W. M. (1979). Introduction to Measurement Theory. Brooks/Cole. ISBN: 978-0818501333
उपनाम	Madde Yanlılık Analizi (DIF — Differential Item Functioning), item bias analysis, Mantel-Haenszel DIF, Lord chi-square DIF	Madde Analizi (Klasik Test Kuramı), CTT item analysis, classical item analysis
संबंधित	4	5
सारांश	Differential Item Functioning analysis examines whether examinees from different groups — such as gender, ethnicity, or language background — who have the same underlying ability respond differently to a test item. First formalised by Holland and Thayer in 1988 via the Mantel-Haenszel procedure, it is the principal tool in modern test development for detecting and removing item bias.	Item analysis is the foundational psychometric procedure for evaluating the quality of individual test or scale items within the Classical Test Theory (CTT) framework, as systematised by Allen and Yen (1979) and Crocker and Algina (1986). It produces an item difficulty index, an item discrimination index, and a distractor analysis for each item, enabling test developers to identify items that are too easy, too hard, or failing to separate high- and low-ability respondents.