השוואת שיטות
סקרו את השיטות שבחרתם זו לצד זו; שורות שבהן יש הבדל מודגשות.
| מהימנות מבחן-מבחן חוזר של גרסה מקוצרת× | מהימנות מבחן-מבחן חוזר× | |
|---|---|---|
| תחום | פסיכומטריה | פסיכומטריה |
| משפחה | Latent structure | Latent structure |
| שנת המקור≠ | 1990s–2000s | 1904 |
| הוגה השיטה≠ | Derived from classical test-retest reliability; short-form methodology formalised by Smith, McCarthy & Anderson (2000) among others | Karl Pearson |
| סוג≠ | Reliability estimation | Reliability estimate |
| מקור מכונן≠ | Smith, G. T., McCarthy, D. M., & Anderson, K. G. (2000). On the sins of short-form development. Psychological Assessment, 12(1), 102–111. DOI ↗ | Nunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070478497 |
| כינויים | abbreviated scale temporal stability, short-form temporal consistency, retest reliability of short forms, SF test-retest | stability reliability, temporal stability, repeatability coefficient, TRT reliability |
| קשורות | 4 | 4 |
| תקציר≠ | Short-form test-retest reliability quantifies how consistently an abbreviated version of a measurement instrument produces the same scores across two administrations separated by a defined time interval. It is a critical validation step whenever a full-length scale is shortened for practical use, confirming that item reduction has not degraded temporal stability. | Test-retest reliability quantifies the temporal consistency of a measure by correlating scores obtained from the same participants on two separate occasions. It is a cornerstone of psychometric validation, directly indicating whether a scale or instrument yields stable scores when the underlying construct has not changed. |
| ScholarGateמערך נתונים ↗ |
|
|