השוואת שיטות

	Patent Analysis	Horizon Scanning
תחום	Science Technology Studies	Science Technology Studies
משפחה	Process / pipeline	Process / pipeline
שנת המקור	1994	2009
הוגה השיטה	Francis Narin (patent bibliometrics) and the patent-analytics community	William J. Sutherland, Effie Amanatidou, and the foresight/scanning community
סוג	Document-based technological-intelligence process	Systematic search-and-detection process
מקור מכונן	Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155.	Sutherland, W. J., & Woodroof, H. J. (2009). The need for environmental horizon scanning. Trends in Ecology & Evolution, 24(10), 523-527.
כינויים	Patent analytics, Patent bibliometrics, Patent landscaping	Environmental scanning, Weak-signal detection, Emerging-issues analysis
קשורות	4	4
תקציר	Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.	Horizon scanning is the systematic examination of information to detect early signs of potentially important developments—weak signals, emerging issues, and wild cards—before they become obvious or fully formed. By surveying a wide range of sources at the edge of current attention, it gives decision-makers advance warning of opportunities and threats and supplies the raw material for foresight, scenario building, and anticipatory policy.