Vertaile menetelmiä

	Kaksiparametrinen logistinen IRT-malli (2PL)	Rasch-malli
Tieteenala	Psykometriikka	Psykometriikka
Menetelmäperhe	Latent structure	Latent structure
Syntyvuosi	1980	1960
Kehittäjä	Frederic M. Lord	Georg Rasch
Tyyppi	Item response model / latent trait model	Item Response Theory / Latent trait model
Alkuperäislähde	Lord, F. M. (1980). Applications of Item Response Theory to Practical Testing Problems. Erlbaum.	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
Rinnakkaisnimet	two-parameter logistic model, 2PL model, 2PL IRT — İki Parametreli Madde Tepki Modeli	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
Liittyvät	6	6
Tiivistelmä	The two-parameter logistic item response model, formalised by Frederic Lord (1980), describes the probability that a respondent answers a binary test item correctly as a smooth S-shaped function of the respondent's latent ability. By estimating a separate discrimination parameter for each item alongside a difficulty parameter, 2PL allows items to differ in how sharply they distinguish high- from low-ability respondents — making it the standard model for large-scale educational and psychological assessments.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.