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| Lyhytmuotoisen testin uudelleentestauksen reliabiliteetti× | Testi-uusintatestausreliabiliteetti× | |
|---|---|---|
| Tieteenala | Psykometriikka | Psykometriikka |
| Menetelmäperhe | Latent structure | Latent structure |
| Syntyvuosi≠ | 1990s–2000s | 1904 |
| Kehittäjä≠ | Derived from classical test-retest reliability; short-form methodology formalised by Smith, McCarthy & Anderson (2000) among others | Karl Pearson |
| Tyyppi≠ | Reliability estimation | Reliability estimate |
| Alkuperäislähde≠ | Smith, G. T., McCarthy, D. M., & Anderson, K. G. (2000). On the sins of short-form development. Psychological Assessment, 12(1), 102–111. DOI ↗ | Nunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070478497 |
| Rinnakkaisnimet | abbreviated scale temporal stability, short-form temporal consistency, retest reliability of short forms, SF test-retest | stability reliability, temporal stability, repeatability coefficient, TRT reliability |
| Liittyvät | 4 | 4 |
| Tiivistelmä≠ | Short-form test-retest reliability quantifies how consistently an abbreviated version of a measurement instrument produces the same scores across two administrations separated by a defined time interval. It is a critical validation step whenever a full-length scale is shortened for practical use, confirming that item reduction has not degraded temporal stability. | Test-retest reliability quantifies the temporal consistency of a measure by correlating scores obtained from the same participants on two separate occasions. It is a cornerstone of psychometric validation, directly indicating whether a scale or instrument yields stable scores when the underlying construct has not changed. |
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