Vertaile menetelmiä

	Faasikenttämallinnus	XRD Rietveld-mallinnus
Tieteenala	Materiaalitiede	Materiaalitiede
Menetelmäperhe	Process / pipeline	Process / pipeline
Syntyvuosi	1958	1969
Kehittäjä	John W. Cahn	Hugo Rietveld
Tyyppi	Simulation method	Refinement method
Alkuperäislähde	Cahn, J. W. (1958). Free energy of a nonuniform system: Interfacial free energy. The Journal of Chemical Physics, 28(2), 258-267.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Rinnakkaisnimet	phase-field method, diffuse interface method	Rietveld refinement, powder diffraction refinement
Liittyvät	3	3
Tiivistelmä	Phase-Field Modeling (PFM) is a continuum computational method for simulating microstructure evolution, phase transitions, and interfacial dynamics without explicitly tracking moving boundaries. Developed from Cahn-Ginzburg-Landau theory in the 1950s, PFM represents distinct phases through continuous order parameters that vary smoothly over diffuse interfaces. This approach elegantly handles topological changes (nucleation, coalescence, pinch-off), complex interface geometries, and strongly coupled multiphysics. It is the dominant method for studying dendritic growth, spinodal decomposition, grain evolution, and reactive transport in materials science.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.