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Ordinaalinen Rasch-malli (Rating Scale- ja Partial Credit -mallit)×Differentiaalinen kohdefunktionaalisuus (DIF)×
TieteenalaPsykometriikkaPsykometriikka
MenetelmäperheLatent structureLatent structure
Syntyvuosi1978–19821970s–1993
KehittäjäDavid Andrich (RSM, 1978); Geoff Masters (PCM, 1982)William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
TyyppiItem response model for ordered categoriesItem-level bias detection
AlkuperäislähdeAndrich, D. (1978). A rating formulation for ordered response categories. Psychometrika, 43(4), 561–573. DOI ↗Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
RinnakkaisnimetRating Scale Model, Partial Credit Model, RSM, PCMDIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Liittyvät65
TiivistelmäThe ordinal Rasch model extends the dichotomous Rasch framework to items with ordered response categories such as Likert-type scales. It places both persons and items on a shared interval-level metric, enabling principled measurement from ordinal data while checking whether items function consistently across all response thresholds.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGateVertaile menetelmiä: Ordinal Rasch Model · Differential Item Functioning. Haettu 2026-06-17 osoitteesta https://scholargate.app/fi/compare