Vertaile menetelmiä

	Many-Facet Rasch Measurement	Rasch-malli
Tieteenala	Education	Psykometriikka
Menetelmäperhe	Latent structure	Latent structure
Syntyvuosi	1989	1960
Kehittäjä	John Michael Linacre	Georg Rasch
Tyyppi	Rasch model extension adding rater and other facets to person and item	Item Response Theory / Latent trait model
Alkuperäislähde	Linacre, J. M. (1989). Many-Facet Rasch Measurement. MESA Press. ISBN: 9780941938020	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
Rinnakkaisnimet	MFRM, Many-Faceted Rasch Model, Facets Model, Linacre Facets Model	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
Liittyvät	4	6
Tiivistelmä	Many-facet Rasch measurement (MFRM) extends the basic Rasch model to assessments mediated by raters. Beyond examinee ability and item difficulty, it adds explicit parameters for rater severity and for any other facet of the rating situation — task, occasion, rating criterion — placing them all on one common logit scale. Developed by John Michael Linacre, MFRM lets analysts estimate and adjust for the fact that some raters are systematically harsh and others lenient, producing 'fair' ability estimates that do not penalize an examinee for happening to draw a severe judge.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.