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| Vastausfunktioiden teoria (IRT)× | Rasch-malli× | |
|---|---|---|
| Tieteenala | Psykometriikka | Psykometriikka |
| Menetelmäperhe | Latent structure | Latent structure |
| Syntyvuosi≠ | 1952–1968 | 1960 |
| Kehittäjä≠ | Frederic M. Lord (and Allan Birnbaum for the 2PL/3PL models) | Georg Rasch |
| Tyyppi≠ | Probabilistic measurement model | Item Response Theory / Latent trait model |
| Alkuperäislähde≠ | Lord, F. M. & Novick, M. R. (1968). Statistical Theories of Mental Test Scores. Addison-Wesley. link ↗ | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| Rinnakkaisnimet | IRT, latent trait theory, item characteristic curve theory, modern test theory | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| Liittyvät≠ | 5 | 6 |
| Tiivistelmä≠ | Item response theory models the probability that a respondent answers an item correctly (or endorses it) as a function of the respondent's latent trait level and the item's own statistical properties — difficulty, discrimination, and guessing. Unlike classical test theory, IRT places persons and items on the same scale, yielding measurement that is sample-independent for items and test-independent for persons. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
| ScholarGateAineisto ↗ |
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