Vertaile menetelmiä

	Valon dynaaminen sironta	XRD Rietveld-mallinnus
Tieteenala	Materiaalitiede	Materiaalitiede
Menetelmäperhe	Process / pipeline	Process / pipeline
Syntyvuosi	1964	1969
Kehittäjä	Robert Pecora	Hugo Rietveld
Tyyppi	Measurement method	Refinement method
Alkuperäislähde	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Rinnakkaisnimet	DLS, photon correlation spectroscopy, particle size measurement	Rietveld refinement, powder diffraction refinement
Liittyvät	3	3
Tiivistelmä	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.