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| BET-pinta-ala× | XRD Rietveld-mallinnus× | |
|---|---|---|
| Tieteenala | Materiaalitiede | Materiaalitiede |
| Menetelmäperhe | Process / pipeline | Process / pipeline |
| Syntyvuosi≠ | 1938 | 1969 |
| Kehittäjä≠ | Brunauer, Emmett, Teller | Hugo Rietveld |
| Tyyppi≠ | Measurement method | Refinement method |
| Alkuperäislähde≠ | Brunauer, S., Emmett, P. H., & Teller, E. (1938). Adsorption of gases in multimolecular layers. Journal of the American Chemical Society, 60(2), 309-319. DOI ↗ | Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71. DOI ↗ |
| Rinnakkaisnimet≠ | BET analysis, nitrogen adsorption, surface area measurement | Rietveld refinement, powder diffraction refinement |
| Liittyvät | 3 | 3 |
| Tiivistelmä≠ | Brunauer-Emmett-Teller (BET) Surface Area Analysis is a technique for measuring the specific surface area of solids by analyzing their nitrogen adsorption isotherms. Developed by Brunauer, Emmett, and Teller in 1938, BET theory extends monolayer adsorption (Langmuir) to multilayer adsorption, enabling quantification of surface area of porous and powdered materials. It is the industry standard for characterizing catalysts, adsorbents, pharmaceuticals, and porous materials, providing critical data for performance prediction and quality control. | XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification. |
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