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SIBTEST×مدل DINO×
حوزهروان‌سنجیروان‌سنجی
خانوادهLatent structureLatent structure
سال پیدایش19932006
پدیدآورRichard Shealy, William F. StoutJames Templin, Russell Henson
نوعDifferential item functioning (DIF) assessmentDisjunctive latent class model
منبع بنیادینShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305. DOI ↗
نام‌های دیگرDINO
مرتبط54
خلاصهSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist.
ScholarGateمجموعه‌داده
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  3. PUBLISHED
  1. v1
  2. 3 منابع
  3. PUBLISHED

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ScholarGateمقایسهٔ روش‌ها: SIBTEST · DINO Model. بازیابی‌شده در 2026-06-17 از https://scholargate.app/fa/compare