مقایسهٔ روش‌ها

	تحلیل درخت خطا (FTA)	تحلیل درخت رویداد (ETA)	تحلیل قابلیت اطمینان آماری
حوزه	قابلیت اطمینان	قابلیت اطمینان	قابلیت اطمینان
خانواده	Process / pipeline	Process / pipeline	Regression model
سال پیدایش	1981	2002	1998
پدیدآور	Vesely et al. (US NRC Fault Tree Handbook)	Andrews & Moss	William Meeker & Luis Escobar
نوع	Deductive top-down failure analysis	Forward inductive logic tree	Parametric lifetime modeling
منبع بنیادین	Vesely, W. E., Goldberg, F. F., Roberts, N. H., & Haasl, D. F. (1981). Fault Tree Handbook (NUREG-0492). U.S. Nuclear Regulatory Commission.	Andrews, J. D., & Moss, T. R. (2002). Reliability and Risk Assessment (2nd ed.). Professional Engineering Publishing. ISBN: 978-1-86058-290-5	Meeker, W. Q., & Escobar, L. A. (1998). Statistical Methods for Reliability Data. Wiley. ISBN: 978-0-471-14328-4
نام‌های دیگر	FTA, Fault Tree Method, Top-Down Reliability Analysis, Hata Ağacı Analizi	ETA, Event Sequence Diagram Analysis, Initiating Event Analysis, Olay Ağacı Analizi	Life Data Analysis, Survival Analysis (Engineering), Time-to-Failure Analysis, Güvenilirlik Analizi
مرتبط	3	2	3
خلاصه	Fault Tree Analysis (FTA) is a top-down, deductive reliability method that begins with an undesired top-level failure event and systematically traces backward through chains of contributing causes using Boolean logic gates (AND, OR). First formalized by Watson at Bell Telephone Laboratories in 1961 and later standardized by Vesely, Goldberg, Roberts, and Haasl in the landmark 1981 NRC Fault Tree Handbook, FTA has become a cornerstone of quantitative risk assessment in nuclear, aerospace, and industrial safety engineering.	Event Tree Analysis (ETA) is a forward inductive technique used in reliability and risk engineering to model the possible outcomes that follow an initiating event. Starting from a single undesired event, ETA traces all subsequent event sequences through a binary branching tree representing the success or failure of safety barriers and protective systems. Introduced formally in reliability and risk literature by Andrews and Moss (2002), it is widely applied in nuclear, chemical, and aerospace industries to quantify accident sequence probabilities and guide safety decision-making.	Statistical reliability analysis models the time-to-failure of components, systems, or products using parametric lifetime distributions fitted to observed or censored failure data. Formalized comprehensively by William Q. Meeker and Luis A. Escobar in their 1998 Wiley monograph, the framework integrates maximum likelihood estimation, censoring mechanisms, and distributional diagnostics to produce probability-of-failure curves, hazard rates, and quantile estimates that support design, warranty, and maintenance decisions.