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Ordinaalüksuste analüüs×Eristusfunktsioneerimine (DIF)×
ValdkondPsühhomeetriaPsühhomeetria
PerekondLatent structureLatent structure
Tekkeaasta1950s–1980s1970s–1993
LoojaClassical test theory tradition (Guilford, Nunnally, and others)William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
TüüpItem-level diagnosticItem-level bias detection
AlgallikasNunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070474659Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
Rööpnimetuseditem analysis for ordinal data, polytomous item analysis, Likert item analysis, OIADIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Seotud65
KokkuvõteOrdinal item analysis evaluates each individual item in a rating-scale or Likert-type instrument using descriptive and correlational statistics suited to ordered categorical response formats. It guides item selection and refinement by flagging items with problematic difficulty, poor discrimination, or low corrected item-total correlations before reliability and validity studies proceed.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGateVõrdle meetodeid: Ordinal Item Analysis · Differential Item Functioning. Loetud 2026-06-17 aadressilt https://scholargate.app/et/compare