Võrdle meetodeid

	Aatomijõu mikroskoopia	Vickersi kõvadus
Valdkond	Materjaliteadus	Materjaliteadus
Perekond	Process / pipeline	Process / pipeline
Tekkeaasta	1986	1922
Looja	Gerd Binnig	Smith and Sandland
Tüüp	Imaging technique	Hardness test
Algallikas	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Smith, E., & Sandland, G. E. (1922). An accurate method of determining the hardness of metals with particular reference to high-hardness alloys. The Institution of Steel Engineers, 8, 623-641.
Rööpnimetused	AFM, scanning probe microscopy, nanoindentation microscopy	Vickers hardness test, Vickers microhardness, HV
Seotud	3	3
Kokkuvõte	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Vickers Hardness testing is a mechanical characterization technique for determining material hardness by pressing a diamond pyramid indenter into a material surface under controlled load and measuring the resulting indent dimensions. Invented by Smith and Sandland in 1922, Vickers hardness is applicable across an enormous hardness range (1-2000 HV) using the same indenter geometry at different loads. It is the most versatile hardness test, widely used in materials science, metallurgy, and quality control for assessing material strength and comparing alloy performance.