Σύγκριση μεθόδων

	Νανοεπανακοπή	Μικροσκοπία Ατομικής Δύναμης	Δυναμική Σκέδαση Φωτός
Πεδίο	Επιστήμη Υλικών	Επιστήμη Υλικών	Επιστήμη Υλικών
Οικογένεια	Process / pipeline	Process / pipeline	Process / pipeline
Έτος προέλευσης	1992	1986	1964
Δημιουργός	Warren Oliver	Gerd Binnig	Robert Pecora
Τύπος	Measurement method	Imaging technique	Measurement method
Θεμελιώδης πηγή	Oliver, W. C., & Pharr, G. M. (1992). An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. Journal of Materials Research, 7(6), 1564-1583.	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.
Εναλλακτικές ονομασίες	nanoindentation, instrumented indentation, depth-sensing indentation	AFM, scanning probe microscopy, nanoindentation microscopy	DLS, photon correlation spectroscopy, particle size measurement
Συναφείς	3	3	3
Σύνοψη	Nanoindentation, or instrumented indentation, is a technique for measuring the hardness and elastic modulus of materials by pressing a hard probe into a sample surface and continuously recording load and penetration depth. Developed by Oliver and Pharr in 1992, nanoindentation enables measurement of mechanical properties of thin films, small volumes, and nanoscale structures with spatial resolution approaching micrometers. It is the standard tool in materials science for characterizing coatings, interfaces, and mechanical properties at the submicron scale.	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.