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| Kort Form Rasch Model× | Rasch-modellen× | |
|---|---|---|
| Fagområde | Psykometri | Psykometri |
| Familie | Latent structure | Latent structure |
| Oprindelsesår≠ | 1960 (Rasch model); short-form application from 1980s onward | 1960 |
| Ophavsperson | Georg Rasch | Georg Rasch |
| Type≠ | Probabilistic item response model | Item Response Theory / Latent trait model |
| Oprindelig kilde≠ | Rasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut. link ↗ | Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen. link ↗ |
| Aliasser≠ | Rasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch model | 1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model |
| Relaterede | 6 | 6 |
| Resumé≠ | The short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items. | The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons. |
| ScholarGateDatasæt ↗ |
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