পদ্ধতির তুলনা করুন

	CIPS Test	PANIC টেস্ট: সাধারণ উপাদান বিয়োজনের সাথে প্যানেল ইউনিট রুট বিশ্লেষণ
ক্ষেত্র	অর্থমিতি	অর্থমিতি
পরিবার	Hypothesis test	Hypothesis test
উদ্ভবের বছর	2007	2004
প্রবর্তক	M. Hashem Pesaran	Jushan Bai & Serena Ng
ধরন	Panel unit-root test with cross-section dependence	Panel unit root test
মৌলিক উৎস	Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312.	Bai, J., & Ng, S. (2004). A PANIC attack on unit roots and cointegration. Econometrica, 72(4), 1127–1177.
অপর নাম	Pesaran CIPS Test, Cross-Sectionally Augmented IPS, Second-Generation Panel Unit-Root Test, CIPS Birim Kök Testi	Panel Analysis of Non-stationarity in Idiosyncratic and Common Components, Bai-Ng PANIC Test, Second-Generation Panel Unit Root Test, Panel Birim Kök Testi (PANIC)
সম্পর্কিত	3	3
সারসংক্ষেপ	The CIPS test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed for panels in which the cross-sectional units share unobserved common factors that induce cross-section dependence. By augmenting each individual ADF regression with cross-sectional averages and their lags, the CIPS test accounts for this dependence and produces reliable inference where first-generation tests such as the original IPS test break down. It is widely applied in macroeconomic and finance panels where shocks propagate across countries or regions.	PANIC (Panel Analysis of Non-stationarity in Idiosyncratic and Common Components) is a second-generation panel unit root test introduced by Bai and Ng (2004). It decomposes each panel series into common factors and idiosyncratic components, then tests for unit roots in each part separately, making it robust to cross-sectional dependence — a critical limitation of first-generation tests such as IPS or LLC.