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| Рентгеново разсейване на малки ъгли (SAXS)× | EXAFS× | |
|---|---|---|
| Област | Спектроскопия | Спектроскопия |
| Семейство | Process / pipeline | Process / pipeline |
| Година на възникване≠ | 1954 | 1971 |
| Създател≠ | Otto Kratky | Edward Stern |
| Тип≠ | Synchrotron/X-ray technique | Synchrotron technique |
| Основополагащ източник≠ | Glatter, O., & Kratky, O. (1982). Small Angle X-ray Scattering. Academic Press. link ↗ | Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI ↗ |
| Други названия | SAXS, small-angle scattering | EXAFS spectroscopy, X-ray absorption spectroscopy |
| Свързани | 3 | 3 |
| Резюме≠ | Small-Angle X-ray Scattering (SAXS) is a solution-phase X-ray scattering technique that measures the overall shape and size of macromolecules and nanoparticles by analyzing scattering intensity at low angles (0.1-10 degrees). Developed by Kratky and colleagues in the 1950s, SAXS provides information about molecular radius, aggregation state, and overall shape without requiring crystallization or fixing, making it ideal for studying native protein conformations and dynamics. | Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge. |
| ScholarGateНабор от данни ↗ |
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